Materials Characterization
A 300kV Field-Emission Gun Energy-Filtering High-Resolution Scanning Transmission Electron Microscope Tecnai F30 is available for HRTEM characterization:
The 300kV field-emission gun energy-filtering high-resolution analytical scanning transmission electron microscope Tecnai F30 (made by FEI) in the Center for Surface Analysis of Materials (CSAM) at CWRU.
A 200kV Conventional Analytical Transmission Electron Microscope (Philips CM20) is used for everyday-work and all Ph.D. candidates are trained by Research Scientist John Sears to use it:
The Philips CM20 transmission electron microscope has an accelerating voltage of 200 kV and is equipped with a LaB6 filament and a side-entry stage. This instrument is particularly suitable for CTEM (conventional TEM), including bright-field imaging, dark-field imaging, and weak-beam dark-field imaging of defects in crystalline materials.
The X-Ray Photo-Electron Spectrometry System Perkin-Elmer PHI-5600 allows for surface compositional analysis and is heavily in use for our nanomaterials doping projects:
The Perkin-Elmer PHI-5600 XPS (X-ray photo-electron spectrometry or "ESCA," "electron spectroscopy for chemical analysis") system includes a conventional dual anode X-ray source (Mg and Al), a 50 cm hemispherical electron energy analyzer, a XYZT sample stage with eight sample storages, and an inert gas sputtering source (PHI-04-303) for sample cleaning and depth profiling.
For Structural Ananlysis An Advanced Diffraction System Scintag X-1 is Used on Everyday Basis:
The Scintag X-1 advanced X-ray diffractometer is available for X-ray diffraction experiments. Normal theta-theta scans are routine, but it is also possible to record rocking curves and sample-tilting curves.
For more useful instrumentation at our CWRU facility see:
Center for Surface Analysis of Materials (CSAM)